IEEE VLSI Test Symposium

IEEE VLSI Test Symposium

4.11 - 1251 ratings - Source

circuit dependent. 11. ... References [I] Akers, S.B., Binary Decision Diagrams, IEEE Transactions on Computers, Vol. ... Decision Diagram Size when representing classes of Symmetric Functions, Journal of Electronic Testing: Theory and Applications (JETTA), Vol. ... 97-104, . [10] Ross D. E., M. R. Mercer, Calculating Logic Functions Via Ordered Partial Multi-Decision Diagrams, Personal Communication.

Title:IEEE VLSI Test Symposium
Publisher: - 1993

You must register with us as either a Registered User before you can Download this Book. You'll be greeted by a simple sign-up page.

Once you have finished the sign-up process, you will be redirected to your download Book page.

How it works:
  • 1. Register a free 1 month Trial Account.
  • 2. Download as many books as you like (Personal use)
  • 3. Cancel the membership at any time if not satisfied.

Click button below to register and download Ebook
Privacy Policy | Contact | DMCA