Bias Temperature Instability for Devices and Circuits

Bias Temperature Instability for Devices and Circuits

4.11 - 1251 ratings - Source



This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.8.8 Schematic drawing of the Pb0 and Pb1 Si/SiO2 interface defects ( Reproduced from [42]) Fig. ... The sketches provide only a crude semiquantitative representation (Reproduced from [19]) Silicon Bandgap Energy [eV] -0.2 0.1 0.4 0.7 1 S D R I n t e n s i t y [ A r b . ... The Pb0 dashed lines are included as merely a guide for the eye (Reproduced from [19]) Si analog, the Pb0 center, have a broadly peakedanbsp;...


Title:Bias Temperature Instability for Devices and Circuits
Author: Tibor Grasser
Publisher:Springer Science & Business Media - 2013-10-22
ISBN-13:

You must register with us as either a Registered User before you can Download this Book. You'll be greeted by a simple sign-up page.

Once you have finished the sign-up process, you will be redirected to your download Book page.

How it works:
  • 1. Register a free 1 month Trial Account.
  • 2. Download as many books as you like (Personal use)
  • 3. Cancel the membership at any time if not satisfied.


Click button below to register and download Ebook
Privacy Policy | Contact | DMCA